M. Ray Mercer is a professor emeritus in the department. His research interests include: the computer-aided design of digital systems, design verification, simulation, design for testability, the modeling of logic networks, automatic test pattern generation, distributed computation, commun-ications and fault-tolerant computing.

Previously, Mercer worked at: The University of Texas at Austin; AT&T Bell Laboratories; Hewlett-Packard Laboratories; and General Telephone and Electronics. He holds a B.S.E.E. from Texas Tech University, an M.S.E.E. from Stanford University and a Ph.D. in electrical engineering from The University of Texas at Austin.

Mercer also was the program chairman for the 1989 International Test Conference and holds two patents in design for testability. In 1986 he became a National Science Foundation Presidential Young Investigator and has won best paper awards at the International Test Conference (in 1982), the Design Automation Conference (in 1991) and the VLSI Test Symposium (in 1999). He is a Fellow of the IEEE.

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